High Quality Test Solutions for Secure Applications
White Paper
ABSTRACT
Designs for secure applications such as smart cards and those used in the defense industry require security to ensure sensitive data is inaccessible to outside agents. Conversely, scan chains have been used for decades to improve access to internal logic for automatic tester equipment (ATE) so that devices can be tested efficiently and quickly. Traditionally designers have used logic BIST for secure applications. There are now additional options using embedded deterministic test (EDT) for secure applications.
In this paper, we will explore the techniques currently in use for testing devices designed for secure application and review the benefits and challenges of each available solution.
Related Resources
Automated Test Creation for Mixed Signal IP using IJTAG
The creation of test patterns for mixed signal IP has been, to a large extent, a manual effort. To improve the process used to test, access, and control embedded IP, the new IEEE P1687 standard 1 is being...
TAGS: IC Design, IJTAG, JTAG, Tessent IJTAG
Tessent Product Suite Overview
Technology Overview 04:11Tessent Product Suite Overview
Built on the foundation of the best-in-class test tools for each test discipline, Tessent® brings these solutions together in a powerful test platform that ensures total chip coverage.
Tessent IJTAG - Technical Background
Technology Overview 13:33Tessent IJTAG - Technical Background
You would like to know more about IEEE P1687? In this presentation we look at the problems IEEE P1687 address, we look how it solves these problems elegantly, and which components of your design IEEE P1687...
TAGS: IEEE P1687, Tessent IJTAG