Designs for secure applications such as smart cards and those used in the defense industry require security to ensure sensitive data is inaccessible to outside agents. Conversely, scan chains have been used for decades to improve access to internal logic for automatic tester equipment (ATE) so that devices can be tested efficiently and quickly. Traditionally designers have used logic BIST for secure applications. There are now additional options using embedded deterministic test (EDT) for secure applications.
In this paper, we will explore the techniques currently in use for testing devices designed for secure application and review the benefits and challenges of each available solution.