Plug-and-Play Test Strategy for 3D ICs
Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis
Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent...
Tessent Cell-Aware Test
Tessent Cell-Aware ATPG is a transistor-level ATPG-based test methodology that achieves significant quality and efficiency improvements by directly targeting specific shorts; opens and transistor defects...
Mentor Test Announcements at 2013 ITC
Steve Pateras talks to EDA Café about what's new and hot in test from Mentor.