Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis
Plug-and-Play Test Strategy for 3D ICs
As the industry transitions to 3D ICs, new test strategies are being developed to meet to two 3D IC test goals: improving the pre-packaged test quality and establishing new tests between the stacked die....
Tessent Cell-Aware Test
Tessent Cell-Aware ATPG is a transistor-level ATPG-based test methodology that achieves significant quality and efficiency improvements by directly targeting specific shorts; opens and transistor defects...
Mentor Test Announcements at 2013 ITC
Steve Pateras talks to EDA Café about what's new and hot in test from Mentor.