Identifying Systematic Yield Limiters Using Scan Test Diagnosis
ISTFA 2013 Tools of the Trade: Mentor Graphics
This video features information on Mentor Graphics' Tessent Diagnosis software, as demonstrated at ISFTA 2013's "Tools of the Trade" tour.
Accelerating Yield and Failure Analysis with Diagnosis
In this webinar you will learn about ways that allow failure analysis to regain its effectiveness and position as a key contributor to yield improvement in digital semiconductor devices, as well as significantly...
Defect Localization Using Diagnosis w/Demo
At ISTFA 2012, Mentor Graphics' Geir Eide, talks about how to localize defects using scan test diagnosis. This presentation includes a closer look at Tessent Diagnosis results and a demonstration of...