At ISTFA 2012, Mentor Graphics' Geir Eide, talks about how to localize defects using scan test diagnosis. This presentation includes a closer look at Tessent Diagnosis results and a demonstration of the Tessent YieldInsight product. The International Symposium on Testing and Failure Analysis (ISTFA), sponsored by EDFAS, creates a unique venue for equipment suppliers, users and analysts to come together.
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Diagnosis, Diagnosis driven yield analysis, Scan Test Diagnosis, silicon learning, yield analysis