Tessent Cell-Aware Test
Plug-and-Play Test Strategy for 3D ICs
As the industry transitions to 3D ICs, new test strategies are being developed to meet to two 3D IC test goals: improving the pre-packaged test quality and establishing new tests between the stacked die....
Process Technology Disruptions and the Evolution of Diagnosis Driven Yield Analysis
Recent technology nodes have each brought about new process challenges that introduced manufacturing defects which required new yield learning methods. This presentation takes a look back at the recent...
Mentor Test Announcements at 2013 ITC
Steve Pateras talks to EDA Café about what's new and hot in test from Mentor.