Silicon Learning
The Tessent® silicon learning products increase productivity during critical silicon validation and yield ramp phases. The products provide solutions for test bring-up, silicon characterization, diagnosis-driven yield analysis, and failure analysis. Combining statistical analysis and scan diagnosis has been shown to reduce time to root cause of yield loss.
Products
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Tessent SiliconInsight
Tessent® SiliconInsight® provides an automated interactive environment for test bring-up, debug, and silicon characterization of devices containing Tessent BIST capabilities. It can greatly increase productivity for chip designers and test engineers during silicon validation and debug, speeding time-to-market. Tessent SiliconInsight reduces test and silicon bring-up time with interactive debug and characterization for benchtop environments.
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Tessent Diagnosis
Tessent® Diagnosis performs accurate and high-resolution test failure diagnosis to determine a defect’s most probable failure mechanism, logic location, and physical location. The tool uses failure data from manufacturing test, scan test patterns, and design information. With this data, Tessent Diagnosis identifies the location and classification of the defect causing the failure.
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Tessent YieldInsight
Tessent® YieldInsight statistically analyzes diagnosis data to identify and separate systematic yield limiters before failure analysis. This eliminates the need for costly physical localization and reduces the time to determining root cause of yield loss from weeks to days. Selection of die for failure analysis is facilitated by automatically identifying die that clearly exhibit the identified systematic issues.
Datasheets
Toolbox
Tessent Training
We have training courses available for Tessent products in our training centers around the world, online, or at your site.
Contact Mentor Graphics
- Request Information or call toll free: 1-800-547-3000