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The Tessent® silicon learning products increase productivity during critical silicon validation and yield ramp phases. The products provide solutions for test bring-up, silicon characterization, diagnosis-driven yield analysis, and failure analysis. Specialized statistical analysis eliminates diagnosis noise and accelerates the time to root cause of yield loss.


Mentor Graphics Tessent Diagnosis performs accurate and high-resolution test failure diagnosis to determine a defect’s most probable failure mechanism, logic location, and physical location. The tool... Tessent Diagnosis

Tessent YieldInsight™ statistically analyzes diagnosis data to identify and separate systematic yield limiters before any failure analysis is done. Tessent YieldInsight

Mentor Graphics Tessent SiliconInsight® provides an automated interactive environment for test bring-up, debug, and silicon characterization of devices containing Tessent BIST capabilities. It can greatly... Tessent SiliconInsight

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