The Tessent® silicon learning products increase productivity during critical silicon validation and yield ramp phases. The products provide solutions for test bring-up, silicon characterization, diagnosis-driven yield analysis, and failure analysis. Specialized statistical analysis eliminates diagnosis noise and accelerates the time to root cause of yield loss.
Mentor Graphics Tessent Diagnosis performs accurate and high-resolution test failure diagnosis to determine a defect’s most probable failure mechanism, logic location, and physical location. The tool...
Tessent YieldInsight™ statistically analyzes diagnosis data to identify and separate systematic yield limiters before any failure analysis is done.