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The Tessent® silicon learning products increase productivity during critical silicon validation and yield ramp phases. The products provide solutions for test bring-up, silicon characterization, diagnosis-driven yield analysis, and failure analysis. Specialized statistical analysis eliminates diagnosis noise and accelerates the time to root cause of yield loss.

Products

Tessent Diagnosis

Mentor Graphics Tessent Diagnosis performs accurate and high-resolution test failure diagnosis to determine a defect’s most probable failure mechanism, logic location, and physical location. The tool... View Product Overview

Tessent YieldInsight

Tessent YieldInsight™ statistically analyzes diagnosis data to identify and separate systematic yield limiters before any failure analysis is done. View Product Overview

Tessent SiliconInsight

Mentor Graphics Tessent SiliconInsight® provides an automated interactive environment for test bring-up, debug, and silicon characterization of devices containing Tessent BIST capabilities. It can greatly... View Product Overview

 
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