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The Tessent® silicon learning products increase productivity during critical silicon validation and yield ramp phases. The products provide solutions for test bring-up, silicon characterization, diagnosis-driven yield analysis, and failure analysis. Specialized statistical analysis eliminates diagnosis noise and accelerates the time to root cause of yield loss.

Products

Mentor Graphics Tessent Diagnosis performs accurate and high-resolution test failure diagnosis to determine a defect’s most probable failure mechanism, logic location, and physical location. The tool... Tessent Diagnosis

Tessent YieldInsight™ statistically analyzes diagnosis data to identify and separate systematic yield limiters before any failure analysis is done. Tessent YieldInsight

Mentor Graphics Tessent SiliconInsight® provides an automated interactive environment for test bring-up, debug, and silicon characterization of devices containing Tessent BIST capabilities. It can greatly... Tessent SiliconInsight

 
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