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Foundry Solution Blog

Posts tagged with 'IC'

16 Jan, 2014

Shelly Stalnaker With the move to small geometries, existing fault models such as stuck-at, transition, bridging, open, and small-delay are becoming less effective at ensuring desired quality levels. While these models only consider faults on cell inputs/outputs and interconnect lines between cells, more defects increasingly occur within the cell structures. A new cell-aware test that directly targets specific shorts, … Read More

test pattern, Tessent, defect detection, ATPG, IC, scan test, fault models, FinFET

13 Dec, 2013

Shelly Stalnaker Press releases can make it seem like EDA tool qualification for a particular IC process node is the “end game.” But in truth, qualification is just the first publicly visible step of ongoing collaborations between an EDA vendor and the foundry. Michael White takes you behind the curtain for a peek at what goes on during qualification from start to finish, as part of his ongoing Silicon Edge series … Read More

tool qualification, tapeout, DRM, Foundry, design rule manual, process design kit, rule deck, IC, PDK

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