News and Articles
News and Press
- Mentor Graphics Announces that ON Semiconductor Completed Multiple Successful Tapeouts Using Pyxis Custom Router
- Samsung and Mentor Graphics Expand Calibre Signoff and Foundry Mask Processing Solution for 20nm
- Hitachi Employs Mentor Graphics Olympus-SoC Place and Route Platform for Critical ASIC Designs
- TowerJazz Finds a Unique Solution for Advanced ESD and Power Domain Checking in Calibre PERC
- SMIC Employs Mentor Graphics Calibre PERC for Reliability Verification of Multi-Power Domain SoCs
- GLOBALFOUNDRIES Improves IC Reliability with Customized Circuit Checks Using Mentor Graphics Calibre PERC
- Mentor Embedded Continues to Simplify Linux and Open Source Development with Support of the Yocto Project
- Calibre Flow Developed with Mentor Graphics Consulting Boosts GLOBALFOUNDRIES Silicon Yield
- Mentor Graphics Announces PADS Release Targeting Design-for-Manufacturing (DFM) Analysis, High-Speed and Interactive Routing
- Samsung DFM Ready for 20 nm Based on Mentor Graphics Calibre Platform
- IEEE Board of Directors Elevates Janusz Rajski to the Grade of IEEE Fellow
- Mentor Graphics and JEOL to Develop Advanced IC Mask Writing Solutions
- Mentor Graphics Announces Completion of 20 nm Test Chip Tapeout with STMicroelectronics Using Olympus-SoC Place and Route System
- Mentor Graphics and TSMC Address Advanced Node Fill Requirements Using Calibre SmartFill
- Mentor Graphics Vista ESL Platform Takes Center Stage in Mentor’s ESL Strategy with Expanded Functionality
- Mentor Graphics Signs AMDL as New Distributor in India
- Mentor Graphics and GLOBALFOUNDRIES Improve Yield Analysis with Combination of Tessent and Calibre Capabilities
- GLOBALFOUNDRIES and Mentor Graphics Extend Collaboration to Third Generation of DFM
- Mentor Graphics Tessent YieldInsight Demonstrates Faster IC Failure and Yield Analysis at Fujitsu
- Mentor Graphics Introduces Calibre RealTime for Instant Signoff Verification of Custom IC Designs
- MediaTek Adopts Mentor Graphics Calibre PERC as its ESD and Circuit Reliability Verification Solution
- VIA Technologies Adopts Mentor Graphics Calibre PERC for Critical ESD Checking
- Mentor Graphics Calibre PERC Programmable Electrical Rule Checker Improves Fujitsu Chip Reliability
- STARC Advances Test of Low Power ICs Using Mentor Graphics Tessent TestKompress
- Mentor Graphics Completes Test Chip with IC Implementation Flow for Common Platform 32/28nm Technology
- NVIDIA uses Mentor’s Olympus-SoC Place and Route System for Leading-Edge Graphics Processors
- Mentor Graphics Design-to-Silicon Solutions Used in Successful Development of TSMC 28nm Product Qualification Vehicle Test Chip
- Mentor Graphics Calibre Co-Development of TSMC’s iLVS Simplifies Modeling of Advanced Devices for Physical Verification
- SMIC Bases DFM Sign-off Strategy on Mentor Graphics Calibre Platform
- Freescale Semiconductor Collaborates with Mentor Graphics on Tessent Silicon Test, Yield Analysis, Calibre Physical Verification and DFM
- Mentor Graphics Outlines Strategy to Unify Silicon Test and Yield Analysis
- New Mentor Graphics Tessent YieldInsight Product Improves IC Yield through Statistical Analysis of Test Failure Data
- Mentor Graphics Delivers Must-have Reference for the Open Verification Methodology (OVM)
- Trident Microsystems Adopts Mentor Graphics Veloce Hardware Emulator to Accelerate Time-To-Market for their Next Generation Digital TV SoCs
- TSMC Selects Calibre Physical Verification Platform for Integrated Sign-off Flow
- GLOBALFOUNDRIES Selects Mentor Graphics Calibre Platform for Computational Lithography and DFM Enablement
- Mentor Graphics Chairman and CEO to Present Keynote at the PLM Road Map 2009 Conference
- Mentor Graphics and Applied Materials Deploy OASIS.MASK Open Data Standard for Higher Efficiency Mask Manufacturing
- Mentor Graphics Acquires LogicVision; Unites BIST, ATPG and Test Pattern Compression Technologies
- Mentor Graphics Announces Complete Design through Manufacturing Solution in TSMC Reference Flow 10.0
- Mentor Releases New Calibre Versions Using Interoperable iDRC and iLVS Formats Introduced by TSMC
- UMC Qualifies Comprehensive Mentor Graphics Silicon Test Suite for its 65nm and 40nm IC Reference Flows
- Mentor Graphics Announces All-Calibre Physical Verification and DFM Flow for Advanced IC Designs at Fujitsu Microelectronics
- Mentor Graphics Appoints New Vice President of Human Resources
- Mentor Graphics TestKompress ATPG Software Wins Test & Measurement World’s Test of Time Award
- Mentor Graphics Provides Complete 3D Variability Solution Addressing Density and Thickness Challenges
- Cambridge Silicon Radio Limited Successfully Deploys Calibre DFM Solutions to Help Drive Rapid Process Migration
- Mentor Graphics Olympus P&R and Calibre Verification Platforms Qualified for 32nm IC Designs at STMicroelectronics
- Mentor Graphics’ Olympus-SoC Place-and-Route System Wins 2009 DesignVision Award
- Mentor Graphics DFT Tools Adopted by STMicroelectronics for Advanced IC Testing Solutions
- Mentor Graphics and Freescale Expand Collaboration to Improve Manufacturing and Testing of Nanometer Technologies
- Mentor Graphics Olympus-SoC Place-and-Route System Qualifies for TSMC 40nm Processes
- NEC Electronics Selects Mentor Graphics Calibre nmLVS for Advanced Circuit Characterization at 40nm and Below
- Mentor Graphics Olympus-SoC Place-and-Route System Slashes Design Closure Times with Industry’s First Parallel Timing Analysis and Optimization Technology
- TSMC Adopts Mentor Graphics Calibre Equation-Based DRC Feature for Advanced Physical Verification
- IBM and Mentor Graphics to Develop 22nm Computational Lithography Solution for the Integrated Circuit Industry
- Mentor Consulting Slashes Time-to-Mask at Dongbu HiTek with Optimized Calibre Flow
- Mentor Graphics' Calibre nmOPC Product Wins SI Editors’ Choice Best Product Award
- Mentor Graphics Provides Advanced Design For Manufacturing Capabilities in TSMC Reference Flow 9.0
- Mentor Graphics Calibre nmOPC on Cell/B.E. Platform Qualified for Production at IBM
Foundry Resources
Mask data preparation flow for advanced technology nodes
White Paper: The trend to reduce critical features dimension has dramatically increased design file size. Design tape–out flows at the 28 nm technology node handle post-OPC data files that reach hundreds of gigabytes.... View White Paper
Roadmap to sub-nanometer OPC model accuracy
White Paper: OPC models describe the entire patterning process, including photomask, optics, resist, and etch as a set of separately characterized modules. It is difficult, however, to definitively calibrate the optics... View White Paper