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Resources

Showing: 41-65 of 67 total resources
1-25 | 26-50 | 51-67
Resource Type Design Area
Roadmap to sub-nanometer OPC model accuracy White Paper IC Manufacturing
High Performance Electrical Driven Hotspot Detection Solution for Full Chip Design using a Novel Device Parameter Matching Technique White Paper IC Design
Integration of Pattern Matching© into Verification Flows White Paper IC Manufacturing , IC Design
Automated Yield Enhancements Implementation on full 28nm Chip: Challenges and Statistics White Paper IC Design
Smart Double-Cut Via Insertion Flow With Dynamic Design-Rules Compliance For Fast New Technology Adoption White Paper IC Design
Advanced Memory Cell Characterization with Calibre xACT 3D White Paper IC Design
U8500 Smartphone Platform at the Head of the Class with Calibre SmartFill Technology White Paper IC Design
The Roadmap to LFD Value: Quantifying a Return on Investment in Calibre LFD White Paper IC Design
Restrictive Design Rules and Their Impact on 22 nm Design and Physical Verification White Paper IC Design
Layout Pattern Dependence-Aware Highly Accurate Simulation Flow with Calibre nmLVS White Paper IC Design
Layout-Aware Diagnosis White Paper Silicon Test and Yield Analysis
Chip-Scale Copper Electroplating and CMP Simulator White Paper IC Manufacturing , IC Design
Signal Integrity Optimization with Olympus-SoC White Paper IC Design
A Case Study: Critical Area and Critical Feature Analysis of Production 90nm Designs at LSI Corporation White Paper IC Design
Equation-Based DRC: A Novel Approach to Resolving Complex Nanometer Design Issues White Paper IC Design
Your Fill Solution Should Match Your Fill Analysis White Paper IC Design
Implementation-Quality Prototyping with Olympus-SoC: Accelerating Design Closure for Advanced ICs White Paper IC Design
Critical Feature Analysis as Golden Path to DFM Closure White Paper IC Design
Calibre Rule Code Testability: The Good, The Bad, and The Ugly White Paper IC Design
Litho Friendly Design Kit: A Tool of DFM Strategy White Paper IC Design
Design for Variability: Managing Design, Process, and Manufacturing Variations in Physical Design White Paper IC Design
Integrated DFM framework for dynamic yield optimization White Paper IC Design
Via Doubling to Improve Yield White Paper IC Design
DFM: What is it and what will it do? White Paper IC Design
Customer Insights: Freescale uses Calibre PERC for schematic, latch-up and SoC Testimonial IC Design
Showing: 41-65 of 67 total resources
1-25 | 26-50 | 51-67