Resources

Showing: 41-51 of 51 total resources
1-25 | 26-50 | 51-51
Resource Type Design Area
A Case Study: Critical Area and Critical Feature Analysis of Production 90nm Designs at LSI Corporation White Paper IC Design
Equation-Based DRC: A Novel Approach to Resolving Complex Nanometer Design Issues White Paper IC Design
Your Fill Solution Should Match Your Fill Analysis White Paper IC Design
Implementation-Quality Prototyping with Olympus-SoC: Accelerating Design Closure for Advanced ICs White Paper IC Design
Critical Feature Analysis as Golden Path to DFM Closure White Paper IC Design
Calibre Rule Code Testability: The Good, The Bad, and The Ugly White Paper IC Design
Litho Friendly Design Kit: A Tool of DFM Strategy White Paper IC Design
Design for Variability: Managing Design, Process, and Manufacturing Variations in Physical Design White Paper IC Design
Integrated DFM framework for dynamic yield optimization White Paper IC Design
Via Doubling to Improve Yield White Paper IC Design
DFM: What is it and what will it do? White Paper IC Design
Showing: 41-51 of 51 total resources
1-25 | 26-50 | 51-51