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Automated Yield Enhancements Implementation on full 28nm Chip: Challenges and Statistics
White Paper
IC Design
Smart Double-Cut Via Insertion Flow With Dynamic Design-Rules Compliance For Fast New Technology Adoption
White Paper
IC Design
Advanced Memory Cell Characterization with Calibre xACT 3D
White Paper
IC Design
U8500 Smartphone Platform at the Head of the Class with Calibre SmartFill Technology
White Paper
IC Design
The Roadmap to LFD Value: Quantifying a Return on Investment in Calibre LFD
White Paper
IC Design
Restrictive Design Rules and Their Impact on 22 nm Design and Physical Verification
White Paper
IC Design
Layout Pattern Dependence-Aware Highly Accurate Simulation Flow with Calibre nmLVS
White Paper
IC Design
Layout-Aware Diagnosis
White Paper
Silicon Test and Yield Analysis
Chip-Scale Copper Electroplating and CMP Simulator
White Paper
IC Manufacturing
,
IC Design
Signal Integrity Optimization with Olympus-SoC
White Paper
IC Design
A Case Study: Critical Area and Critical Feature Analysis of Production 90nm Designs at LSI Corporation
White Paper
IC Design
Equation-Based DRC: A Novel Approach to Resolving Complex Nanometer Design Issues
White Paper
IC Design
Your Fill Solution Should Match Your Fill Analysis
White Paper
IC Design
Implementation-Quality Prototyping with Olympus-SoC: Accelerating Design Closure for Advanced ICs
White Paper
IC Design
Critical Feature Analysis as Golden Path to DFM Closure
White Paper
IC Design
Calibre Rule Code Testability: The Good, The Bad, and The Ugly
White Paper
IC Design
Litho Friendly Design Kit: A Tool of DFM Strategy
White Paper
IC Design
Design for Variability: Managing Design, Process, and Manufacturing Variations in Physical Design
White Paper
IC Design
Integrated DFM framework for dynamic yield optimization
White Paper
IC Design
Via Doubling to Improve Yield
White Paper
IC Design
DFM: What is it and what will it do?
White Paper
IC Design
Showing:
31-51 of 51 total resources
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