Calibre Fundamentals: DFM Case Studies
Categories: Calibre
Calibre Fundamentals: DFM Case Studies introduces you to the state-of-the-art tools and processes required for success when designing deep sub-micron integrated circuits. View course highlights ↓
Scheduled classes
| Date | Location | Time | Language | Price | |
|---|---|---|---|---|---|
| Oct 24–25 | Fremont | 9–5 PM PDT |
English | 1,600 USD | Register |
| Don't see the class you need? Request a class | |||||
Course Highlights
As process feature sizes become increasingly smaller, Design for Manufacture (DFM) considerations have grown in importance. A growing number of foundries are requiring DFM analysis, especially below 65nm, and engineers who design deep sub-micron chips will need to become familiar with DFM tools and processes. This course will expose you to key concepts, tools, and processes through a series of case studies. Each case study highlights a particular aspect of DFM, facilitating both a better understanding of the problem and the use of the relevant Mentor Graphics software.
You Will Learn How To:
- Describe the common causes of manufacturing-related chip failure
- Find printing hotspots using the Calibre Litho-Friendly Design (LFD) tool
- Perform 3-dimensional CMP hotspot analysis with the Calibre Chemical Mechanical Polishing Analyzer (CMPA) tool
- Identify layout areas susceptible to random particle damage using the Critical Area Analysis (CAA) feature of the Calibre YieldAnalyzer tool
- Use foundry-provided data with Calibre DFM tools
- Incorporate DFM results with layout design flows
Hands-On Labs
- Using Calibre LFD to find layout litho hotspots
- Analyzing chip planarity with Calibre CMPAnalyzer
- Performing critical area analysis with Calibre YieldAnalyzer
Course Details
| Prerequisites |
|
| Course Part Number |
|
| Products Covered | |
| Guides |