The Tessent® MemoryBIST course will help you understand how to implement DFT for memory test. You will be introduced to Tessent™ technology and automation tools, building upon a recommended flow that a hardware engineer adding Built-In Self-Test (BIST) should follow. View course details ↓
Full instructor-led courses in a Mentor training facility, with complete course materials and access to classroom computers.
|Dec 2–3||Hsinchu City||9–5 PM
|Dec 4–5||Beijing||9–5 PM
|Dec 29–30||Shanghai||9–5 PM
|Jan 13–14||Austin||9–5 PM
|Jan 19–20||Bangalore||9:30–5:30 PM
|Mar 2–3||Tempe||9–5 PM
|Apr 14–15||Marlborough||9–5 PM
|May 18–19||Fremont||9–5 PM
|Jul 21–22||Austin||9–5 PM
|Don't see the class you need? Request a class|
The lecture/lab format of the class gives you a conceptual understanding of how BIST circuitry for random logic and memories can be automatically generated and inserted into a circuit.
Hands-on lab exercises will reinforce lecture and discussion topics under the guidance of our industry expert instructors.
You will learn how to
- Perform DFT design rule checking on a chip design for embedded memory test using the Tessent MemoryBIST flow
- Generate, insert, and verify Tessent MemoryBIST IP in a design
- Perform DFT design rule checking on a chip design for TAP and boundary scan test
- Troubleshoot common problems: blocked clocks, clock gaters, tool limitations with language constructs
- Define an alternative clock for BIST
- Use properties to sensitize clock paths through muxes and clock gating cells
- Use custom algorithms and user-defined sequences to limit runs to specific controllers, if programmable
- Use custom algorithms to define initialization sequences during start up, like that used to initialize a PLL
- Generate, insert, and verify the TAP and boundary-scan logic at the chip level
- Perform basic memory analysis and repair
- Demonstrate the flow for Tessent Boundary Scan, and Tessent MemoryBIST
- Labs focus on the flow and give you an example of some basic features of the Tessent IP
- The labs serve as a template for use when implementing DFT on a user-generated design
logic design engineers who understand IC DFT concepts (i.e., Scan-ATPG-ATE) and tools and need to understand DFT Embedded Test IP tools and DFT Embedded Test IP methodologies.
Test engineers who want to understand how Embedded Test impact their test flow.
2 years experience in ASIC design using RTL
2 years experience using DFT tools for scan insertion and ATPG
Basic understanding of DFT flows and DFT methodology
Experience with HDL-based logic synthesis
Experience with UNIX directories and editing text files (for lab exercises)
|Course Part Number||