Tessent Scan and ATPG

The Tessent™ Scan and ATPG course will drive the development of your skills and knowledge in scan and ATPG design processes utilizing the Tessent DFTAdvisor point tool, Tessent FastScan™, Tessent TestKompress®, Tessent Fastscan MacroTest™, and the Tessent point tool DFTVisualizer. ModelSim® is used to simulate mismatches in some of the labs. This course teaches you how to insert full scan in a design using the DFTAdvisor™ tool flow, and shows you how to create high quality test patterns using the ATPG tool flow. This course also teaches you ATPG compression techniques along with industry-standard Tessent TestKompress compression techniques.

Course Highlights

You will learn how to

• Analyze ATPG messaging
• Achieve high test coverage
• Create high quality patterns
• Perform advanced test methodologies
• Troubleshoot areas of low test coverage
• Achieve high test pattern compression
• Troubleshoot DRC violations and simulation mismatches
• Use Tessent TestKompress to create compact pattern sets

Hands-on labs

• Accessing documentation and getting help
• Using the scan and ATPG tool flow (with and without a design rule violation)
• Setting up new and existing scan pins (internal or external)
• Balancing scan chains with multiple clock domains
• Writing and editing scan chain order files and stitching
• Reading and analyzing messages
• Determining the cause of undetected faults
• Using common methodologies to attain a quick estimate of test coverage
• Creating and saving patterns in different formats
• Verifying patterns using ModelSim
• Reading ASCII files into Tessent FastScan
• Modifying timeplates
• Using traditional ATPG compression techniques
• Using basic Tessent TestKompress compression techniques
• Creating fault models and fault grading
• Using Tessent FastScan MacroTest and top-up ATPG
• Fault-grading boundary scan and top-up ATPG
• Troubleshooting areas of low test coverage