Sign In
Forgot Password?
Sign In | | Create Account

Tessent Scan and ATPG

Categories: Tessent

The Tessent®: Scan and ATPG course will drive the development of your skills and knowledge in scan and ATPG design processes utilizing the Tessent Scan point tool, Tessent FastScan™, Tessent TestKompress®, and the Tessent point tool DFTVisualizer. View course details ↓


Live Online classes deliver all the interactivity and depth of the traditional classroom, from the convenience of your own computer, with hands-on exercises and course materials. Learn more about Live Online training

Date Time Language Price
Apr 28–May 52015 8–2 PM
English 3,200 USD Register


Full instructor-led courses in a Mentor training facility, with complete course materials and access to classroom computers.

Date Location Time Language Price
Feb 24–272015 Tempe Arizona 9–5 PM
English 3,200 USD Register
Mar 2–52015 Singapore Singapore 9–5 PM
English 2,500 USD Register
Mar 9–122015 Herzliya Israel 9–5 PM
English 9,332 ILS Register
Mar 23–262015 Fremont California 9–5 PM
English 3,200 USD Register
Mar 24–252015 Hsinchu City Taiwan 9–5 PM
Mandarin 23,100 TWD Register
Apr 7–102015 Shanghai China 9–5 PM
Mandarin 10,400 CNY Register
Apr 27–302015 Beijing China 9–5 PM
Mandarin 10,400 CNY Register
May 11–142015 Fremont California 9–5 PM
English 3,200 USD Register
Jun 9–122015 Austin Texas 9–5 PM
English 3,200 USD Register
Sep 14–172015 Herzliya Israel 9–5 PM
English 9,332 ILS Register
Sep 21–242015 Meudon France 9–5 PM
English 2,600 EUR Register
Don't see the class you need? Request a class

The Tessent® Scan and ATPG course will drive the development of your skills and knowledge in scan and ATPG design utilizing the Tessent Scan, Tessent FastScan™, and the DFTVisualizer. The knowledge gained for generating test patterns in this class is directly applicable for generating test patterns for designs utilizing Tessent TestKompress. ModelSim® is used to simulate test patterns to identify potential issues (mismatches) between the expected results from pattern generation and the Verilog simulation results. During this course you will insert full scan in a design using Tessent Scan, and create high quality test patterns using the ATPG. You will also learn about ATPG compression techniques including an introduction to Tessent TestKompress.

The hands-on labs are designed to reinforce key concepts through practical experience and to develop proficiency with the Mentor Graphics Tessent tool suite under the guidance of industry-expert instructors.

Course Highlights

You will learn how to

  • Invoke the tessent shell environment in order to utilize Tessent Scan, Tessent FastScan, and Tessent TestKompress.
  • Setup and analyze designs to prepare for ATPG
  • Perform ATPG to achieve high test coverage with a minimal number of patterns
  • Troubleshoot DRC violations
  • Troubleshoot areas of low test coverage
  • Troubleshoot simulation mismatches

Hands-on labs

  • Accessing documentation and getting help
  • Using the scan and ATPG tool flow
  • Reading and analyzing messages
  • Troubleshooting a DRC error in DFTVisualizer
  • Using common methodologies to attain a quick estimate of test coverage
  • Troubleshooting areas of low test coverage
  • Determining the cause of undetected faults
  • Creating and saving patterns in different formats
  • Verifying patterns using ModelSim
  • Reading ASCII files into Tessent FastScan
  • Modifying timeplates
  • Creating fault models and performing fault grading

Course Information

Intended for

Designers, DFT engineers, and test consultants involved with creating testable ASICs and ICs and producing the manufacturing test sets

ATPG test engineers

CAD engineers and managers

CAD staff seeking to understand the effect of DFT on the design flow

Anyone needing a basic to intermediate level of DFT tool flow and concepts


A basic background in DFT

Some knowledge of TCL is helpful

Course Part Number
  • Classroom: 057857
  • Live online: 239701

Recently viewed courses

Online Chat