Tessent Scan and ATPG
- Add Courses
- Confirm Schedule
- Enter Contact Information
| Date Begins | Date Ends | Time | Location | Register |
|---|---|---|---|---|
| Mar 13, 2012 | Mar 16, 2012 | 9:00am - 5:00pm | Fremont, CA | Register |
| May 01, 2012 | May 05, 2012 | 9:00pm - 5:00am | Tempe, AZ | Register |
| Jul 10, 2012 | Jul 13, 2012 | 9:00am - 5:00pm | Austin, TX | Register |
Duration: 4 Days
Pricing: $3,200.00 USD
Course Part Number: 057857
Contact us for details about training at your site
Course Overview
The Tessent™ Scan and ATPG course will drive the development of your skills and knowledge in scan and ATPG design processes utilizing the Tessent DFTAdvisor point tool, Tessent FastScan™, Tessent TestKompress®, Tessent FastScan MacroTest™, and the Tessent point tool DFTVisualizer. ModelSim® is used to simulate mismatches in some of the labs. This course teaches you how to insert full scan in a design using the DFTAdvisor™ tool flow, and shows you how to create high quality test patterns using the ATPG tool flow. This course also teaches you ATPG compression techniques along with industry-standard Tessent TestKompress compression techniques.
The hands-on labs are designed to reinforce key concepts through practical experience and to develop proficiency with the Mentor Graphics Tessent tool suite under the guidance of industry-expert instructors.
You Will Learn How To
- Analyze ATPG messaging
- Achieve high test coverage
- Create high quality patterns
- Perform advanced test methodologies
- Troubleshoot areas of low test coverage
- Achieve high test pattern compression
- Troubleshoot DRC violations and simulation mismatches
- Use Tessent TestKompress to create compact pattern sets
Hands-On Labs
Throughout this course, extensive hands-on lab exercises provide you with practical experience using DFT software. Hands-on lab topics include:
- Accessing documentation and getting help
- Using the scan and ATPG tool flow (with and without a design rule violation)
- Setting up new and existing scan pins (internal or external)
- Balancing scan chains with multiple clock domains
- Writing and editing scan chain order files and stitching
- Reading and analyzing messages
- Determining the cause of undetected faults
- Using common methodologies to attain a quick estimate of test coverage
- Creating and saving patterns in different formats
- Verifying patterns using ModelSim
- Reading ASCII files into Tessent FastScan
- Modifying timeplates
- Using traditional ATPG compression techniques
- Using basic Tessent TestKompress compression techniques
- Creating fault models and fault grading
- Using Tessent FastScan MacroTest and top-up ATPG
- Fault-grading boundary scan and top-up ATPG
- Troubleshooting areas of low test coverage
Prerequisites
- A basic background in DFT