Calibre DFM Yield

 
 
Date BeginsDate EndsTimeLocationRegister
Jul 07, 2008Jul 09, 20089:00am - 5:00pmSan JoseRegister
Jul 22, 2008Jul 24, 20089:00am - 5:00pmSan JoseRegister


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Duration:  3 Days
Price:  $2,400 USD
Course Part Number: 236134

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Course Overview

Description

This course teaches Design for Manufacturability (DFM) users to use Calibre YieldAnalyzer, Calibre YieldEnhancer, and Calibre YieldServer to improve their yield, without increasing the real estate on wafers. The final three class modules introduce the user to DFM rule writing.

Detailed lab exercises help reinforce the lectures and provide you with extensive tool usage experience under the guidance of our industry expert instructors.

You will learn how to

  • Use DFM tools
  • Run DFM rule decks
  • Make changes to DFM rules

Hands-On Labs

Throughout this course, extensive hands-on lab exercises provide you with practical experience using DFM SVRF software to enhance rule decks. Hands-on lab topics include:

  • Basic use of DFM rule files
  • Using Calibre YieldAnalyzer to create DFM rule checks
  • Using Calibre YieldEnhancer to enhance layouts
  • Using YieldServer to create layers interactively from within the DFM-RVE window
  • Using DFM Report Cards to analyze yield problems and enhancements
  • Using Critical Feature Analysis (CFA) rule files
  • Generating Critical Area Analysis (CAA) rule files

Audience

  • IC layout designers and layout verification specialists who would benefit from an intensive course on using DFM tools, running DFM rule decks, and making changes to DFM rules

Prerequisites

  • Basic understanding of SVRF DRC rule writing is absolutely required
  • Working knowledge of the Calibre nmDRC hierarchical engine
  • Familiarity with Calibre RVE, for results visualization.
  • Experience with an IC layout editing tool
  • Familiarity with UNIX
  • Completion of the Calibre DRC/LVS class very highly recommended
  • Experience programming in any language
     

Key Topics

  • YieldAnalyzer
  • YieldEnhancer
  • YieldServer
  • DFM Report Cards
  • Critical Feature Analysis
  • Critical Area Analysis
 
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